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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2021 | Investigation of High-K Gate Dielectrics and Chirality on the Performance of Nanoscale CNTFET | Renuka Devi, L.; Arumugam, N.; Jayanthi, J.E.; Arun, S.T.S.; Ananth, K.T. | Article | -1224779468 | -2061953349 |